| 1 | Check Sample Compatibility | Confirm suitability for solids, powders, liquids, thin films, biological specimens, and rough or uneven surfaces. Typical working distances are approximately 1–20 mm, depending on the objective and sampling accessory. | The sample geometry, transparency, surface roughness, and working distance affect focusing, signal strength, and the risk of contamination or optical damage. | Measure representative samples using the intended holders, objectives, and laser powers. Check whether the full sample area can be accessed without sectioning. |
| 2 | Select an Appropriate Excitation Wavelength | Common excitation wavelengths include 405 nm, 488 nm, 532 nm, 633 nm, and 785 nm. Shorter wavelengths generally provide stronger Raman scattering, while longer wavelengths often reduce visible fluorescence. | Fluorescence, absorption, heating, and photochemical damage vary substantially with wavelength and sample composition. | Test at least two suitable wavelengths on the same sample. Compare fluorescence background, Raman signal-to-noise ratio, spectral quality, and visible sample changes. |
| 3 | Evaluate Spectral Resolution | For many material-identification applications, approximately 1–5 cm−1 resolution is practical. High-resolution research measurements may require around 1 cm−1 or better, depending on the spectrograph design. | Higher spectral resolution helps separate closely spaced Raman bands, identify phase changes, and analyze stress or crystallinity. | Measure a certified Raman standard and verify the observed peak position, full width, calibration stability, and resolution across the required spectral range. |
| 4 | Review Spatial Resolution and Confocal Performance | Lateral resolution is commonly on the order of 0.3–1.0 µm, depending on wavelength, numerical aperture, optical alignment, and sample conditions. Axial sectioning is often approximately 1–5 µm but varies with the optical configuration. | Spatial resolution determines whether individual particles, layers, inclusions, or microscopic defects can be distinguished. | Use a suitable test sample to compare adjacent features, measure point-spread behavior, and check signal rejection from out-of-focus planes. |
| 5 | Assess Measurement Flexibility | Useful capabilities may include point spectra, line scans, 2D Raman mapping, 3D depth profiling, automated stage movement, multiple objectives, and interchangeable sample accessories. | Flexible measurement modes allow one system to support identification, uniformity testing, layer analysis, particle characterization, and failure investigation. | Confirm the available scan area, stage travel, step size, autofocus performance, mapping speed, depth-control method, and file-export options. |
| 6 | Compare Sensitivity, Laser Power, and Acquisition Time | Laser power at the sample may range from microwatts to tens of milliwatts. Acquisition times can range from milliseconds for strong signals to several minutes for weak or highly fluorescent samples. | Sensitivity affects throughput, detection of low-concentration components, and the ability to analyze light-sensitive or heat-sensitive materials. | Build a power-versus-exposure test. Record signal-to-noise ratio, repeatability, baseline behavior, sample temperature, and evidence of photodegradation. |
| 7 | Verify Software, Calibration, and Long-Term Usability | Important functions include cosmic-ray removal, baseline correction, peak fitting, spectral libraries, multivariate analysis, automated calibration, batch processing, and export in common formats such as CSV or TXT. | Efficient software and stable calibration reduce operator dependence and improve consistency between measurements and users. | Run a repeatability study over multiple days. Check calibration drift, user permissions, raw-data access, audit trails, software updates, and training requirements. |